RESOLUTION AND CONTRAST IN THE ELECTRON MICROSCOPE: AN HISTORICAL REVIEWCOSSLETT VE.1982; JOURNAL OF MICROSCOPY (OXFORD); ISSN 0022-2720; GBR; DA. 1982; VOL. 128; NO 1; PP. 23-31; BIBL. 1 P.Article

CURRENT DEVELOPMENTS IN HIGH VOLTAGE ELECTRON MICROSCOPY.COSSLETT VE.1974; J. MICR.; G.B.; DA. 1974; VOL. 100; NO 3; PP. 233-246; BIBL. 2 P. 1/2Article

THE DEVELOPMENT OF ELECTRON MICROSCOPY AND RELATED TECHNIQUES AT THE CAVENDISH LABORATORY, CAMBRIDGE, 1946-79. I: 1946-60COSSLETT VE.1981; CONTEMP. PHYS.; ISSN 0010-7514; GBR; DA. 1981; VOL. 22; NO 1; PP. 3-36; BIBL. 2 P.Article

PENETRATION AND RESOLUTION OF STEM AND CTEM IN AMORPHOUS AND POLYCRYSTALLINE MATERIALSCOSSLETT VE.1979; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1979; VOL. 55; NO 2; PP. 545-548; ABS. GER; BIBL. 12 REF.Article

ELECTRON ENERGY LOSS SPECTROMETRY: MEAN FREE PATHS FOR SOME CHARACTERISTIC X-RAY EXCITATIONSLEAPMAN RD; COSSLETT VE.1976; PHILOS. MAG.; G.B.; DA. 1976; VOL. 33; NO 1; PP. 1-10; BIBL. 23 REF.Article

ADVANCES IN OPTICAL AND ELECTRON MICROSCOPY.BARER R; COSSLETT VE.1968; ACADEMIC.PRESS.LONDON.EDITED.BY.BARER.P.COSSLETT.V.E.; 1968, VOL. 2, P. 1 A 418Miscellaneous

ADVANCES IN OPTICAL AND ELECTRON MICROSCOPY.BARER R; COSSLETT VE.1968; ACADEMIC.PRESS.LONDON.EDITED.BY.BARER.P.COSSLETT.V.E.; 1968, VOL. 2, P. 1 A 418Miscellaneous

RADIATION DAMAGE IN ELECTRON MICROSCOPY OF ORGANIC MATERIALS: EFFECT OF LOW TEMPERATURESSALIH SM; COSSLETT VE.1975; J. MICR.; G.B.; DA. 1975; VOL. 105; NO 3; PP. 269-276; BIBL. 24 REF.Article

ADVANCES IN OPTICAL AND ELECTRON MICROSCOPY.BARER R; COSSLETT VE.1968; ACADEMIC.PRESS.LONDON.EDITED.BY.BARER.P.COSSLETT.V.E.; 1968, VOL. 2, P. 1 A 418Miscellaneous

ADVANCES IN OPTICAL AND ELECTRON MICROSCOPY.BARER R; COSSLETT VE.1968; ACADEMIC.PRESS.LONDON.EDITED.BY.BARER.P.COSSLETT.V.E.; 1968, VOL. 2, P. 1 A 418Miscellaneous

ELECTRON SPECTROMETRY OF INNER SHELL EXCITATIONS.LEADMAN RD; COSSLETT VE.1976; VACUUM; G.B.; DA. 1976; VOL. 26; NO 10-11; PP. 423-426; BIBL. 9 REF.; (CONF. INTERACTION ELECTR. SOLIDS. PROC.; SOUTHAMPTON; 1976)Conference Paper

ADVANCES IN OPTICAL AND ELECTRON MICROSCOPYBARER R; COSSLETT VE.1971; LONDON ACAD. PRESS ?; 1971, VOL. 4, P. 1 A 424Book

THICKNESS EFFECT IN RADIATION DAMAGE; REAL OR ARTEFACT .KARIMAT EL SAYED; SALIH SM; COSSLETT VE et al.1980; MICRON; GBR; DA. 1980; VOL. 11; NO 2; PP. 183-187; BIBL. 6 REF.Article

CONTRIBUTION OF ELECTRON ENERGY LOSS SPECTROSCOPY TO THE DEVELOPMENT OF ANALYTICAL ELECTRON MICROSCOPY.COLLIEX C; COSSLETT VE; LEAPMAN RD et al.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 1; NO 4; PP. 301-315; BIBL. 45 REF.Article